靜態電流-電壓特性曲線圖是半導體元件重要的參數之一,其測量源須達到高精度以及皮米的數量級,本論文提出一個達成此量測源的電路架構. The static I-V characteristic of a semiconductor device is an essential term for the extraction of device parameters itself. It is very common to plot I-V curves with semiconductor device parameter measurement and the source-measure unit (SMU) is one of c
