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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/37499


    Title: SMU Architecture - High Current Resolution
    Authors: 賴瓊惠
    Lai, Chiung-Hui
    Contributors: 電子工程學系
    Electronics Engineering
    Keywords: 量測源單元;保護環;放大器
    SMU;guard ring;OP amp;DUT;Darlington pair
    Date: 2008
    Issue Date: 2014-07-01 10:30:40 (UTC+8)
    Abstract: 靜態電流-電壓特性曲線圖是半導體元件重要的參數之一,其測量源須達到高精度以及皮米的數量級,本論文提出一個達成此量測源的電路架構.
    The static I-V characteristic of a semiconductor device is an essential term for the extraction of device parameters itself. It is very common to plot I-V curves with semiconductor device parameter measurement and the source-measure unit (SMU) is one of c
    Appears in Collections:[Department of Microelectronics] Journal Articles

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