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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/35789


    Title: SDRAM產品預燒時間之研究
    Authors: 謝國台
    HSIEH, KUOTAI A.
    Contributors: 應用統計學系
    Applied Statistics
    Keywords: reliability;Burn-In model;SDRAM;Burn-In error
    Date: 2005
    Issue Date: 2014-06-27 10:49:52 (UTC+8)
    Abstract: Recently, the semiconductor industrial markets are expanding rapidly. To survive on the competitive markets, one must enhance the manufacturing technology and improve the quality and reliability. Cost issue must be considered as well. The purpose of this
    Appears in Collections:[Department of Applied Statistics] Journal Articles

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