Chung-Hua University Repository:Item 987654321/34109
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    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://chur.chu.edu.tw/handle/987654321/34109


    题名: Bondability Study of Chip-on-Film (COF) Inner Lead Bonding (ILB) Using Conventional Gang Bonder
    作者: 陳精一
    Chen, Ching-I
    贡献者: 機械工程學系
    Mechanical Engineering
    关键词: Bondability;chip on film;COF;inner lead bonding;ILB;peeling test
    Bondability;chip on film;COF;inner lead bonding;ILB;peeling test
    日期: 2008
    上传时间: 2014-06-27 02:39:46 (UTC+8)
    摘要: Abstract—Inner lead bonding (ILB) is used to thermomechanically
    join the Cu inner leads on a flexible film tape andAu bumps on
    a driver IC chip to form electrical paths.With the newly developed
    film carrier assembly technology, called chip on film (COF),
    Abstract—Inner lead bonding (ILB) is used to thermomechanically
    join the Cu inner leads on a flexible film tape andAu bumps on
    a driver IC chip to form electrical paths.With the newly developed
    film carrier assembly technology, called chip on film (COF),
    显示于类别:[機械工程學系] 期刊論文

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