Chung-Hua University Repository:Item 987654321/34109
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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/34109


    Title: Bondability Study of Chip-on-Film (COF) Inner Lead Bonding (ILB) Using Conventional Gang Bonder
    Authors: 陳精一
    Chen, Ching-I
    Contributors: 機械工程學系
    Mechanical Engineering
    Keywords: Bondability;chip on film;COF;inner lead bonding;ILB;peeling test
    Bondability;chip on film;COF;inner lead bonding;ILB;peeling test
    Date: 2008
    Issue Date: 2014-06-27 02:39:46 (UTC+8)
    Abstract: Abstract—Inner lead bonding (ILB) is used to thermomechanically
    join the Cu inner leads on a flexible film tape andAu bumps on
    a driver IC chip to form electrical paths.With the newly developed
    film carrier assembly technology, called chip on film (COF),
    Abstract—Inner lead bonding (ILB) is used to thermomechanically
    join the Cu inner leads on a flexible film tape andAu bumps on
    a driver IC chip to form electrical paths.With the newly developed
    film carrier assembly technology, called chip on film (COF),
    Appears in Collections:[Department of Mechanical Engineering] Journal Articles

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