An integrated dispatching rule with on-line rework consideration in wafer fabrication

CHUR > College of Management > Department of Technology Management > Journal Articles > Item 987654321/39966

Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/39966

Title:	An integrated dispatching rule with on-line rework consideration in wafer fabrication
Authors:	沙永傑 SHA, D.Y.
Contributors:	科技管理學系 Technology Management
Keywords:	Circuits;Despatch;Manufacturing systems;Modelling;Simulation
Date:	2009
Issue Date:	2014-07-07 22:03:42 (UTC+8)
Abstract:	In wafer fabrication, the material cost of wafer is expensive. It is imperative to repair the defective wafers produced during the manufacturing process for reducing the cost and increasing the yield of wafer fabrication. However, repairing defective wafe
Appears in Collections:	[Department of Technology Management] Journal Articles

Files in This Item:

File	Description	Size	Format
p_m530_0300.pdf		24Kb	Adobe PDF	130	View/Open