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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/39203


    Title: Novel Tunneling Oxynitride Layer Applied to Floating Gate Flash Memory
    Authors: 賴瓊惠
    Lai, Chiung-Hui
    Contributors: 電子工程學系
    Electronics Engineering
    Keywords: 穿隧含氮氧化層;懸浮閘快閃記憶體
    Tunneling Oxynitride;Floating Gate Flash Memory
    Date: 2010
    Issue Date: 2014-07-07 13:57:09 (UTC+8)
    Abstract: 穿隧含氮氧化層應用於懸浮閘快閃記憶體
    In this letter, we propose a simple novel method to fabricate robust, reliable, high nitrogen content oxynitride dielectrics. Moreover, the
    process can be easily adopted by current manufacturing technology applied to floating gate flash memory. The propos
    Appears in Collections:[Department of Microelectronics] Teachers Books

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