AC-Plus Scan Methodology for Small Delay Testing and Characterization

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题名:	AC-Plus Scan Methodology for Small Delay Testing and Characterization
作者:	田慶誠 Tien, Ching-Cheng
贡献者:	電機工程學系 Electrical Engineering
关键词:	Index Terms—AC scan;characterization;delay testing;small
日期:	2013
上传时间:	2014-06-27 02:28:06 (UTC+8)
摘要:	Abstract—Small delay defects escaping traditional delay testing could cause a device to malfunction in the field and thus detecting these defects is often necessary. To address this issue, we propose three test modes in a new methodology called AC-plus sc
显示于类别:	[電機工程學系] 期刊論文

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